By Gordon Roberts, Friedrich Taenzler, Mark Burns
With the proliferation of complicated semiconductor units containing electronic, analog, mixed-signal, and radio-frequency circuits, modern-day engineer has to be fluent in all 4 circuit forms. Written for complicated undergraduate and graduate-level scholars, in addition to engineering execs, this e-book encompasses analog, mixed-signal and radio-frequency circuits assessments, with many proper business examples. The textual content assumes an effective historical past in analog and electronic circuits and a operating wisdom of desktops and desktop programming. It contains examples and illustrations, that includes state of the art business know-how, to complement and liven up the textual content. The ebook additionally introduces large-scale mixed-signal circuit and person circuit checks, discusses the value-added advantages of mixed-signal IC trying out to a manufacturer's product, and obviously defines the position of the try engineer.
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Extra resources for Introduction to Mixed-Signal IC Test and Measurement
Multisite testing is a process in which multiple devices are tested on the same test head simultaneously with obvious savings in test cost. The word “site” refers to each socketed DUT. For example, site 0 corresponds to the first DUT, site 1 corresponds to the second DUT, and so on. Multisite testing is primarily a tester operating Chapter 1 • Overview of Mixed-Signal Testing system feature, although duplicate tester instruments must be added to the tester to allow simultaneous testing on multiple DUT sites.
Friedman, Digital Systems Testing and Testable Design, revised printing, IEEE Press, New York, January 1998, ISBN 0780310624. 3. P. K. Lala, Practical Digital Logic Design and Testing, Prentice Hall, Upper Saddle River, NJ, 1996, ISBN 0023671718. 4. J. Max Cortner, Digital Test Engineering, John Wiley & Sons, New York, 1987, ISBN 0471851353. 5. D. A. Johns and K. Martin, Analog Integrated Circuit Design, John Wiley & Sons, New York, 1996, ISBN 0471144487. CHAPTER 2 Tester Hardware T his chapter explores the architecture of a mixed-signal ATE tester.
6. The driver circuitry consists of a fixed impedance driver (typically 50 Ω) with two programmable logic levels, VIH and VIL. These levels are controlled by a pair of driver-level DACs whose voltages are controlled by the test program. The driver can also switch into a high-impedance state (HIZ) at any point in the digital pattern to allow data to come from the DUT into the pin card’s comparator. The driver circuits may also include programmable rise and fall times, though fixed rise and fall times are more common.
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