Test and Diagnosis of Analogue, Mixed-Signal and RF by Yichuang Sun

By Yichuang Sun

This e-book offers a entire dialogue of automated trying out, analysis and tuning of analogue, mixed-signal and RF built-in circuits and platforms in one resource. The e-book comprises 11 chapters written by way of top researchers world-wide. in addition to primary strategies and strategies, the e-book reviews systematically the state-of-the-arts and destiny study instructions of those parts. an entire variety of circuit parts are lined and try out matters also are addressed from the SoC point of view.

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Additional resources for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits - The System on Chip Approach

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Faulty class identification of analog circuits’, Proceedings of CIE 3rd National Conference on CAD, Tianjin, 1988, pp. : ‘A topological method of class-fault diagnosis of analog circuits’, Proceedings of IEEE Midwest Symposium on Circuits and Systems, Washington DC, USA, 1992, pp. : ‘Cutset-fault diagnosis of nonlinear circuits’, Proceedings of China International Conference on Circuits and Systems, Nanjing, 1989, pp. , Sun, Y. : ‘Fault diagnosis of analog circuits with tolerances using artificial neural networks’, Proceedings of IEEE APCCAS, Tianjin, China, 2000, pp.

This can reduce computation after test and is good for online test. Because all non-linear branches will be in the faulty branch set and any node or cutset that contains a non-linear component will behave as a faulty one whether or not the non-linear component is faulty, the number of possible faulty branches, nodes and cutsets for branch-, node- and cutset-fault diagnosis will increase. This may require more test nodes for a circuit that contains more non-linear components. In the search of faults, only the k-branch sets that contain all non-linear components, k-node sets containing all nodes connected by non-linear components and k-cutset sets containing all cutsets with non-linear components need to be considered.

Analog fault diagnosis – theory and approaches’, Journal of Dalian Maritime University, 1989;15 (4):67–75 3 Ozawa, T. W. : ‘Test and design for testability of analog and mixed-signal integrated circuits: theoretical basis and pragmatical approaches’ in Dedieu, H. : ‘Efficient methods of fault simulation’, Proceedings of 20th IEEE Midwest Symposium on Circuits and Systems, 1977, pp. : ‘Bilinear relations of networks and their applications’, Proceedings of URSI International Symposium on Signals, Systems and Electronics, Erlangen, Germany, 1989, pp.

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Test and Diagnosis of Analogue, Mixed-Signal and RF by Yichuang Sun
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